You are currently logged in as an
Institutional Subscriber.
If you would like to logout,
please click on the button below.
Home / Publications / E-library page
Only AES members and Institutional Journal Subscribers can download
The authors encountered anecdotal evidence suggesting that field failures of existing line driver and microphone preamplifier integrated circuits (ICs) were correlated with accidental connections between line outputs and microphone inputs with phantom power applied. Analysis showed that the most probable mechanism was large currents flowing as a result of rapid discharge of the high-valued ac-coupling capacitors. Commonly used protection schemes are measured, analyzed, and shown to be lacking. More robust schemes that address these shortcomings are presented. It is concluded that the small additional cost of these more robust protection schemes is likely outweighed by the reduction in field failures and their associated repair cost.
Author (s): Thomas, Frank; Hebert, Gary
Affiliation:
THAT Corporation, Milford, MA
(See document for exact affiliation information.)
AES Convention: 110
Paper Number:5335
Publication Date:
2001-05-06
Import into BibTeX
Session subject:
Microphones
Permalink: https://aes2.org/publications/elibrary-page/?id=10028
(201KB)
Click to purchase paper as a non-member or login as an AES member. If your company or school subscribes to the E-Library then switch to the institutional version. If you are not an AES member Join the AES. If you need to check your member status, login to the Member Portal.
Thomas, Frank; Hebert, Gary; 2001; The 48-Volt Phantom Menace [PDF]; THAT Corporation, Milford, MA; Paper 5335; Available from: https://aes2.org/publications/elibrary-page/?id=10028
Thomas, Frank; Hebert, Gary; The 48-Volt Phantom Menace [PDF]; THAT Corporation, Milford, MA; Paper 5335; 2001 Available: https://aes2.org/publications/elibrary-page/?id=10028