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A study was made of various parameters that influence the sensitivity of transistor microphones, namely: the emitter junction depth; the position of the stressing member on the emitter of the transistor; the n-p-n vs the p-n-p transistors; the magnitude of the collector-to-emitter voltage VCE. The highest sensitivity of the microphone is obtained for a transistor which has a shallow emitter (less than 1 micron) and in which the indenter is positioned where the emitter-base junction meets the surface of the transistor, i.e., at the emitter boundary. The p-n-p and n-p-n transistors behave similarly under stress when the stress is applied at the boundary of the emitter. An increase in VCE enhances the sensitivity, but not by a large amount.
Author (s): Sikorski, M. E.
Affiliation:
Bell Telephone Laboratories, Inc., Murray Hill, NJ
(See document for exact affiliation information.)
Publication Date:
1965-07-06
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Sikorski, M. E.; 1965; Transistor Microphone [PDF]; Bell Telephone Laboratories, Inc., Murray Hill, NJ; Paper ; Available from: https://aes2.org/publications/elibrary-page/?id=1203
Sikorski, M. E.; Transistor Microphone [PDF]; Bell Telephone Laboratories, Inc., Murray Hill, NJ; Paper ; 1965 Available: https://aes2.org/publications/elibrary-page/?id=1203