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All resistors generate white (Johnson-Nysquist) noise based on their value and temperature; they can also generate several other types of (excess) noise. The amount or characteristics of a resistor’s excess noise could be one factor contributing to variations in perceived sound quality. This research explores methods for measuring the Johnson-Nysquist and excess noise of different resistors with the hopes of quantifying the performance of the components under test. A methodology is proposed for evaluating the audibility of both Johnson-Nysquist and excess noise that requires no special measurement equipment, only a sound system with suitable computer and freely available software.
Author (s): LaMacchia, Brewster; Swanson, Bradford
Affiliation:
Clockworks Signal Processing LLC, Andover, MA, USA; Tufts University, Medford, MA, USA
(See document for exact affiliation information.)
AES Convention: 145
Paper Number:486
Publication Date:
2018-10-06
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Session subject:
Posters: Applications in Audio
Permalink: https://aes2.org/publications/elibrary-page/?id=19750
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LaMacchia, Brewster; Swanson, Bradford; 2018; Measuring and Evaluating Excess Noise in Resistors [PDF]; Clockworks Signal Processing LLC, Andover, MA, USA; Tufts University, Medford, MA, USA; Paper 486; Available from: https://aes2.org/publications/elibrary-page/?id=19750
LaMacchia, Brewster; Swanson, Bradford; Measuring and Evaluating Excess Noise in Resistors [PDF]; Clockworks Signal Processing LLC, Andover, MA, USA; Tufts University, Medford, MA, USA; Paper 486; 2018 Available: https://aes2.org/publications/elibrary-page/?id=19750