You are currently logged in as an
Institutional Subscriber.
If you would like to logout,
please click on the button below.
Home / Publications / E-library page
Only AES members and Institutional Journal Subscribers can download
We are all aware of the increasing public attention and concern which is being directed at the noise levels of products ranging from jet aircraft to home refrigerators. The science of noise measurements and the art of noise evaluations are advancing rapidly, and it is worthwhile to review some of the techniques and procedures which can be used to improve the accuracy of the test data, or to simplify the task of securing the data. Usually concern with noise is due to its possible effects upon the people who are exposed to it. Two of these areas of concern, 1) the necessity to eliminate after-effects to the ear from prolonged exposure to noise, and 2) the requirement that reasonable conversational levels can be used in the work environment, can be predicted directly from noise analysis test data. The third factor, annoyance, cannot be so predicted, and is discussed in a later section of this paper.
Author (s): Hamrick, J. J.
Affiliation:
International Business Machines Corporation
(See document for exact affiliation information.)
AES Convention: 9
Paper Number:16
Publication Date:
1957-10-06
Import into BibTeX
Permalink: https://aes2.org/publications/elibrary-page/?id=201
(892KB)
Click to purchase paper as a non-member or login as an AES member. If your company or school subscribes to the E-Library then switch to the institutional version. If you are not an AES member Join the AES. If you need to check your member status, login to the Member Portal.
Hamrick, J. J.; 1957; Techniques for Measuring and Evaluating Noise [PDF]; International Business Machines Corporation; Paper 16; Available from: https://aes2.org/publications/elibrary-page/?id=201
Hamrick, J. J.; Techniques for Measuring and Evaluating Noise [PDF]; International Business Machines Corporation; Paper 16; 1957 Available: https://aes2.org/publications/elibrary-page/?id=201