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The low-frequency performance of a driverfor use in a direct-radiator loudspeaker system is characterized by its Thiele-Small parameters. Two impedance measurements are required for the calculation of these parameters. A fast technique for performing the impedance measurements is presented and the calculation of the basic parameters is reviewed. Computer implementation for numerical calculation and control of the analyzer is discussed and the results for a typical driver are shown.
Author (s): Struck, Christopher J.
Affiliation:
Bruel and Kjaer Instruments Inc., Hoffman Estates, IL
(See document for exact affiliation information.)
AES Convention: 82
Paper Number:2446
Publication Date:
1987-03-06
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Session subject:
Loudspeakers
Permalink: https://aes2.org/publications/elibrary-page/?id=4983
(352KB)
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Struck, Christopher J.; 1987; Determination of the Thiele-Small Parameters Using Two-Channel FFT Analysis [PDF]; Bruel and Kjaer Instruments Inc., Hoffman Estates, IL; Paper 2446; Available from: https://aes2.org/publications/elibrary-page/?id=4983
Struck, Christopher J.; Determination of the Thiele-Small Parameters Using Two-Channel FFT Analysis [PDF]; Bruel and Kjaer Instruments Inc., Hoffman Estates, IL; Paper 2446; 1987 Available: https://aes2.org/publications/elibrary-page/?id=4983