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Response measurements performed using Time Delay Spectrometry utilize a linearly swept sinusoidal excitation signal. Increasing the sweep rate in TDS can result in serious errors in the measured response. A new measurement technique is introduced which allows faster sweep rates to be used than with traditional TDS measurements. This technique enables the correct measurement of the complex time-selective frequency response as well as providing flexibility in the application of windowing functions.
Author (s): Struck, Christopher J.; Biering, C. Henrik
Affiliation:
Brfiel & Kjaer, Naerum, Denmark
(See document for exact affiliation information.)
AES Convention: 90
Paper Number:3038
Publication Date:
1991-02-06
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Session subject:
Loudspeaker Technology and Measurement Techniques
Permalink: https://aes2.org/publications/elibrary-page/?id=5655
(385KB)
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Struck, Christopher J.; Biering, C. Henrik; 1991; A New Technique for Fast Response Measurements Using Linear Swept Sine Excitation [PDF]; Brfiel & Kjaer, Naerum, Denmark; Paper 3038; Available from: https://aes2.org/publications/elibrary-page/?id=5655
Struck, Christopher J.; Biering, C. Henrik; A New Technique for Fast Response Measurements Using Linear Swept Sine Excitation [PDF]; Brfiel & Kjaer, Naerum, Denmark; Paper 3038; 1991 Available: https://aes2.org/publications/elibrary-page/?id=5655