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There is a considerable amount of controversy and misconception surrounding this relatively new control room design concept. The authors propose to outlline the original test data, obtained via TDS, which provided the formulative basis of the concept, and the subsequent developments provided through the use of the Time-Energy-Frequency test system.
Author (s): Davis, Chips; Meeks, Glenn E.
Affiliation:
LEDE Designs, Las Vegas, NV ; E. A. Designs, Indianapolis, IN
(See document for exact affiliation information.)
AES Convention: 72
Paper Number:1954
Publication Date:
1982-10-06
Import into BibTeX
Session subject:
Studio Design and Technology
Permalink: https://aes2.org/publications/elibrary-page/?id=11805
(556KB)
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Davis, Chips; Meeks, Glenn E.; 1982; History and Development of the Lede Control Room Concept [PDF]; LEDE Designs, Las Vegas, NV ; E. A. Designs, Indianapolis, IN; Paper 1954; Available from: https://aes2.org/publications/elibrary-page/?id=11805
Davis, Chips; Meeks, Glenn E.; History and Development of the Lede Control Room Concept [PDF]; LEDE Designs, Las Vegas, NV ; E. A. Designs, Indianapolis, IN; Paper 1954; 1982 Available: https://aes2.org/publications/elibrary-page/?id=11805